Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). The ML4079EN is an 800G BERT ready to support the newly emerging 8 x 100 Gbps technology cycle. Most importantly it supports real hardware FEC analysis to be able to understand the DUT behavior in a system environment. Other features include signal-to-noise ratio (SNR) and histogram measurements, as well as transmitter and receiver equalizers.
Digital sampling oscilloscopes are essential tools for evaluating the performance of transmitters using jitter and eye diagram analysis. They are sometimes applied in unison with a BERT. The BERT generates the digital test pattern, while the oscilloscope analyzes the signal after it has run through the DUT. The ML4015E is a combination optical and electrical sampling oscilloscope, which can be configured with an optical bandwidth of either 25 or 40 GHz at wavelengths ranging from 1260 to 1650 nm single mode or 700 to 870 nm multimode, or with a 32 GHz differential electrical sampler.
Arbitrary Waveform Generators (AWG)
With the accelerated growth of hyperscale datacenters, Ethernet network infrastructure performance demands are increasing exponentially, and customer expectations for high-speed data throughput are at an all-time high. Arbitrary Waveform Generators are the ideal general-purpose development tool for validating high-speed receivers and are extremely flexible instruments for coherent module development. ML4081-X: • 8 or 16 differential Lanes • Routing for both clean and noisy signals • Creates a defined stress source for receivers under test